Diffuse reflectance accessory - Selector
The Selector diffuse reflectance accessory enables solid samples to be analysed without the need for extensive sample preparation. The optimised off-axis configuration of the selector optics reduces unwanted directional reflection to a minimum. Selector almost exclusively collects diffuse reflection, which is particularly relevant for quantitative analysis. A special 45° tilted sample holder enables total reflection of a sample to be analysed.
|Measurement of diffuse or total reflection|
|Macro, micro and tilted sample cup|
|Simple sample handling|
The diffuse reflectance accessory comes complete with micro sample cup, two standard sample cups and a tilted sample cup for total reflectance measurement. In addition, the system comprises a sample holder coated with a nickel diamond abrasive pad. This enables surface samples to be removed from tins, tubes, etc. and analysed directly in the optical path of the reflectance unit. The benefit provided by a nickel diamond lies in a very low spectral background compared to the commonly used SiC.