Desktop electron microscope for large samples

XL from Phenom-World

The Phenom XL enhances the opportunities of the Phenom desktop instruments as it has a big sample chamber and (optional) a secondary electron detector (SED).

It is possible to load 40 sample stubs or a sample with dimensions up to 100 mm x 100 mm x 57 mm. The field of view can be up to 100 mm x 100 mm.

Equipped with an Everhart-Thornley SE detector and an EDX system as an option, the Phenom XL is the most complete instrument in the Phenom Desktop series.

Features
Sample chamber (w) 100 mm x (l) 100 mm x (h) 57 mm, field of view 100 mm x 100 mm
Long-lifetime high-brightness source (CeB6)
Acceleration voltage settings between 4.8 and 15 kV for more functionality
Three vacuum modes: ChargeReduction (60 Pa), standard vacuum (10 Pa) and high vacuum (10-2 Pa)
Sample loading time less than 60 seconds and motorized X/Y-axis

Phenom XL

The Phenom XL features a newly designed chamber including a compact motorized stage. In spite of this much larger sample size, a proprietary loading shuttle keeps the vent/load cycle to a minimum, which in practice enables a throughput that is a few factors higher than any comparable SEM system. The familiar intuitive user interface of the Phenom Desktop SEM remains.

After 5 sec the navigation camera takes a single shoot of the whole chamber (3x – 16x) so you never get lost during your analysis. In less than one minute the sample shuttle is placed in the column. Magnification can be up to 100000x.

Fully equipped with the SE detector and the EDX system the Phenom XL is able to gather almost complete analysis regarding surface topography and composition.

Beside the modes ChargeReduction (to minimize charging and damaging of non-conductive and vacuum sensitive samples) and Standard Vacuum the instrument can be operated in a high vacuum mode for SE images.

Phenom ProSuite

The Pro Suite package was developed to enable Phenom users to extract maximum information from images made with the Phenom desktop scanning electron microscope (SEM):

  • Automated Image Mapping
    Enables automated collection of multiple images in a regular grid
  • Remote User Interface
    Enables the users to access the Phenom desktop SEM from a different location
  • 3D Roughness Reconstruction (option)
    For generation of three-dimensional images and sub-micrometer roughness visualization
  • ParticleMetric (option)
    Fully automated measurements and visual exploration of nano- and microscaled particles
  • PoroMetric (option)
    Allows the user to gather data on distribution of pores and pore parameters like pore size and aspect ratio
  • Fibermetric (option)
    Automated and accurate size information from micro and nano- and microscaled fiber samples
The backscattered electron detector can be operated in either material contrast or topography contrast mode
Charge reduction mode minimizes charging and beam damage of isolating and fragile samples
Acceleration voltage settings in 0,1 kV steps between 4,8 kV and 15 kV give access to surface sensitive investigations and a improved resolution investigating light elements

Contacts

Request further information
Product Manager - Electron microscopy
+49 6151 8806-21
Fax: +49 6151 8806921

Our partner

Follow us: twitter linkedin
European offices
© LOT Quantum Design 2016