Desktop scanning electron microscopes

Desktop or benchtop/tabletop scanning electron microscopes (SEM) provide high-resolution images and chemical anlyses of materials through back scattered electron (BSE), secondary electron (SE) and energy dispersive x-ray (EDX) detection. Desktop SEM are easy to handle and sample preparation takes only little effort.

The Phenom Pure desktop scanning electron microscope (SEM) is an ideal entry-level tool. It is equipped with a 4-quadrant backscattered electron detector to reach a resolution ≤ 30 nm (measured at gold with 5 kV and 6 mm working distance) and a magnification up to 30000x.

The key to the high performance is the combination of components: robust electron optics, high-brightness electron source (CeB6), patented sample container and an intuitive user interface.

The Phenom Pure is upgradeable to a Phenom Pro or Phenom ProX (EDX).

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The Phenom Pro desktop scanning electron microscope (SEM) is one of the most advanced imaging models in the Phenom series. It is equipped with a 4-quadrant backscattered electron detector to reach a resolution ≤ 14 nm (measured at gold with 10 kV and 6 mm working distance) and a magnification up to 130000x.

The key to the high performance is the combination of components: robust electron optics, high-end electron source (CeB6), patented sample container and an intuitive user interface.

The Phenom Pro is upgradeable to a Phenom ProX (EDX).

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The Phenom ProX desktop scanning electron microscope (SEM) is the ultimate all-in-one imaging and X-ray analysis system. It is equipped with a 4-quadrant backscattered electron detector to reach a resolution ≤ 14 nm (measured at gold with 10 kV and 6 mm working distance) and a magnification up to 130000x.

The key to the high performance is the combination of components: robust electron optics, high-end electron source (CeB6), patented sample container and an intuitive user interface.

The Phenom ProX is equipped with the ProSuite PC.

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The Phenom XL enhances the opportunities of the Phenom desktop instruments as it has a big sample chamber and (optional) a secondary electron detector (SED).

It is possible to load 40 sample stubs or a sample with dimensions up to 100 mm x 100 mm x 57 mm. The field of view can be up to 100 mm x 100 mm.

Equipped with an Everhart-Thornley SE detector and an EDX system as an option, the Phenom XL is the most complete instrument in the Phenom Desktop series.

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The Phenom ProSuite was developed to extract information from images made with any Phenom desktop SEM and to automate complicated system control. The Phenom ProSuite software is installed on the Phenom application system. This monitor-mounted PC is the hardware platform for all ProSuite software, leaving the Phenom imaging unit in its original state.

Standardly included are the applications “Automated Image Mapping” and “Remote User Interface”. Further applications (EDX, 3D Roughness Reconstruction, ParticleMetric, PoroMetric, FiberMetric) are available as an option.

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Phenom Pure, Pro or ProX can be equipped with different sample holders and inserts for specific demands

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More than 7 years LOT-QuantumDesign is distributing Phenom Desktop Electron Microscopes. Due to the permanent development of the instruments Phenom Desktop systems are well established with an increasing amount of installations.

On this page we present application reports to give you an insight in the manifold possibilities of Phenom Electron Microscopes. If you want to share your experiences with your Phenom Desktop system we would be pleased to show your application reports on this page.

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