SEM beam blanking

From Deben

Beam blanking, pulsing or otherwise modulating the electron beam for different SEM systems from Hitachi or JEOL

1 kV up to 40 kV
Approximately 50 nsec on/off time for switching
PCD port adapter (uses port opposite to the final aperture)
Integral probe current detector
Plates are made out of cobalt gold coated phosphor bronze


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Product Manager - Electron microscopy & nanotechnology
+49 6151 8806-12
Fax: +49 6151 8806912

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