SEM beam blanking

From Deben

Beam blanking, pulsing or otherwise modulating the electron beam for different SEM systems from Hitachi or JEOL

Features
1 kV up to 40 kV
Approximately 50 nsec on/off time for switching
PCD port adapter (uses port opposite to the final aperture)
Integral probe current detector
Plates are made out of cobalt gold coated phosphor bronze

Contacts

Request further information
Product Manager - Electron microscopy & nanotechnology
+49 6151 8806-12
Fax: +49 6151 8806912

Our partner

Follow us: twitter linkedin facebook
European offices
© LOT Quantum Design 2016