Electron microscopy
Desktop SEM, in-situ stages for EM/TEM/CT, sample preparation, detectors and accessories
- AFSEM - correlative AFM and SEM
- Accessories for SEM applications
- Cryo preparation system for scanning electron microscopy
- Detectors for SEM applications
- Desktop scanning electron microscopes
- In situ stages for electron microscopy and µXCT
- In situ TEM sample-management solutions
- Sample preparation for electron microscopy
- Sputter & carbon coaters
- TEM cameras
- x-ray analytical instrumentation
