Customized control – In situ TEM of curable alloys

EMheaterchips are DENSsolutions latest development. These brand-new, MEMS-based sample holders for in situ TEM measurements are customized and offer unprecedented control over the experiment. In combination with different in situ holders (single tilt, double tilt, 30° and 70°), they offer a great variety of options, for example 3D reconstruction of nanostructures.

HAADF STEM images

Features

  • Sub-Angstrom resolution over the full temperatures range (RT to 1300 K)
  • Real-time feedback control
  • Very fast temperature setting time
  • Ultra high temperature stability

Read the application note for more information on the thermal behavior of nanostructures in aerospace aluminum.

 

Related Products:

In situ TEM sample-management solutions

Contacts

Andreas Bergner
Product Manager - Electron microscopy & nanotechnology
+49 6151 8806-12
Fax: +49 6151 8806912
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