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Workshop WVASE – ellipsometry data analysis February 22 - 24, 2017

Workshop WVASE – ellipsometry data analysis

LOT-QuantumDesign GmbH together with the J.A. Woollam Co., Inc. are happy to announce the next course on WVASE ellipsometry data analysis that targets intermediate to advanced user.

Students should have at least some ellipsometry experience and a proficiency with WVASE software. The course will be divided into sessions that include thin and thick film analysis, transparent and absorbing layers, graded, parameterized optical constants layers, anisotropy. To support the lectures, participants will work examples on individual computers (participants need to bring their own notebook).

Program overview
  1. Theory and overview of modeling process
  2. Transparent materials
  3. Absorbing films
  4. Semi-absorbing films
  5. Thin absorbing films
  6. Anisotropy

Information and registration


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Contact

Thomas Wagner
Product Manager - Ellipsometry & Surface Science
+49 6151 8806-68
Fax: +49 6151 8806968
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