Introductory Seminar: Spectroscopic Ellipsometry
LOT-QuantumDesign GmbH, Darmstadt
This seminar offers a short introduction* and an overview of the current status of application and research in ellipsometry. We will demonstrate the power of the Woollam spectroscopic ellipsometers by undertaking various sample measurements.
In the last few years the areas where spectroscopic ellipsometry is used are permanently growing due to the increasing need to characterise multilayer and multicompound systems. This technique allows very sensitive measurement of film thickness, optical constants, composition, surface and interface roughness and many more.
Increasingly applications close to production are developing alongside its traditional use for research.
This requirement has been addressed by the development of several in-situ solutions for process monitoring and control. During the seminar we will present well-established systems like VASE, M-2000, RC2, Alpha-SE and showcase latest developments like our new iSE to address the requirements of in-situ applications.
Systems will be available to demonstrate sample measurements.
Registration Introductory Seminar: Spectroscopic Ellipsometry
The number of participants for the seminar is limited to 17 persons.
After receiving your registration we will send a short confirmation. Final confirmation including program and description how to reach LOT-QD premises and the hotel. The seminar will start at 09:00h and will end at around 17:00h in the afternoon.
All seminar expenses including lunch will be covered by LOT-QuantumDesign GmbH.
Travel and hotel expenses are to be paid and organized by the participants. We have pre-reserved a limited number of hotel rooms at 80,50 € plus 9,50€ for breakfast at the Contel Hotel in Darmstadt within 10 minutes walking distance of the teaching venue, pre-reservation will be held until September 27th 2018. To book a room please phone: +49-6151-800900 and quote the code: LOT08102019
*) The introductory seminar is considered for participants without any ellipsometry experience. Due to the huge interest last year, and the limitation of registrations we ask ellipsometer users not to register for this seminar.